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A probabilistic theory of pattern recognition
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A probabilistic theory of pattern recognition

Author: Luc Devroye; László Györfi; Gábor Lugosi
Publisher: New York : Springer, ©1996.
Series: Applications of mathematics, 31
Edition/Format: Book : EnglishView all editions and formats
Summary:
Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy,
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Details

Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Luc Devroye; László Györfi; Gábor Lugosi
ISBN: 0387946187 9780387946184
OCLC Number: 33276839
Description: xv, 636 p. : ill. ; 24 cm.
Contents: Introduction -- The Bayes Error -- Inequalities and alternate distance measures -- Linear discrimination -- Nearest neighbor rules -- Consistency -- Slow rates of convergence -- Error estimation -- The regular histogram rule -- Kernel rules -- Consistency of the k-nearest neighbor rule -- Vapnik-Chervonenkis theory -- Combinatorial aspects of Vapnik-Chervonenkis theory -- Lower bounds for empirical classifier selection -- The maximum likelihood principle -- Parametric classification -- Generalized linear discrimination -- Complexity regularization -- Condensed and edited nearest neighbor rules -- Tree classifiers -- Data-dependent partitioning -- Splitting the data -- The resubstitution estimate -- Deleted estimates of the error probability -- Automatic kernel rules -- Automatic nearest neighbor rules -- Hypercubes and discrete spaces -- Epsilon entropy and totally bounded sets -- Uniform laws of large numbers -- Neural networks -- Other error estimates -- Feature extraction.
Series Title: Applications of mathematics, 31
Responsibility: Luc Devroye, László Györfi, Gábor Lugosi.
More information: Publisher description | Table of contents only

Abstract:

Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, tree classifiers, and neural networks.

Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.

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